有机薄膜的表征

本书特色

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　　《材料表征原版系列丛书:有机薄膜的表征(英文)》主要内容包括：preparation and materials langmuir—blodgett
films、l—b films oflong—chain compounds、cyclic compounds and
chromophores、polymers and proteins、polymerization in situ、alternation films
（superlattices）、self—assembled monoiayers等。

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内容简介

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作者简介

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作者：（美国）布伦德尔（C.Richard Brundle） （美国）埃文斯（Charles A.Evans） （美国）乌尔曼（Abraham Ulman）
　　乌尔曼（Abraham Ulman），Analytical tools for the study of organic thin films
have seen dramatic developments in the last decade.Using such tools it has
become possible to obtain structural information at the molecular level and thus
to relate materials structure to materials properties.Characterization of
Organic Thin Films will help materials scientists， physicists， chemists， and
biologists develop a fundamental understanding of structure—properties
relationships which in turn makes possible molecular engineering of advanced
materials and opens new opportunities in molecular manufacturing.This volume
begins with introduc—tory chapters on Langmuir—Blodgett and self—assembled
films， and continues with the discussion of their properties as studied by
different analytical tech—niques.Both their surface/interfacial and bulk
properties are covered. 

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目录

preface to the reissue of the materials characterization series preface to series preface to the reissue of characterization of organic thin films preface contributors part ⅰ： preparation and materials langmuir—blodgett films 1.1 introduction 1.2 l—b films oflong—chain compounds fattyacids amines other long—chain compounds 1.3 cyclic compounds and chromophores 1.4 polymers and proteins 1.5 polymerization in situ 1.6 alternation films （superlattices） 1.7 potentiaiapplications self—assembled monoiayers 2.1 introduction 2.2 monolayers of fatty acids 2.3 monolayers of organosilicon derivatives 2.4 monolayers of alkanethiolates on metal and semiconductor surfaces 2.5 self—assembled monolayers containing aromatic groups 2.6 conclusions partⅱ： analysis of film and surfaceproperties spectroscopic ellipsometry 3.1 introduction and overview 3.2 theory of ellipsometry 3.3 instrumentation 3.4 determination of optical properties analysis of single eliipsometric spectra： direct inversion methods analysis of single ellipsometric spectra： least— squares regression analysis method analysis of multiple ellipsometric spectra 3.5 determination of thin film structure thickness determination for monolayers microstructural evolution in thick film growth 3.6 future prospects infrared spectroscopyin the characterization of organic thin films 4.1 introduction specific needs for characterizing organic thin films general prinaples and capabilities of infrared spectroscopy for surface and thin film analysis 4.2 quantitative aspects spectroscopiclntensities electromagnetic fields in thin film structures 4.3 the infrared spectroscopic experiment general instrumentation experimental modes additional aspects 4.4 examples of applications self—assembled monolayers on gold by external reflection octadecylsiloxane monolayers on sio2 bytransmission langmuir—blodgett films on nonmetallic substrates by external reflection raman spectroscopic characterization of organic thin films 5.1 introduction 5.2 fundamentalsoframan spectroscopy 5.3 instrumentaiconsiderations 5.4 raman spectroscopic approaches for the characterization oforganicthin films integrated opticaiwaveguide raman spectroscopy （iowrs） total internal reflection raman spectroscopy surface enhanced raman scattering normal raman spectroscopy resonance raman spectroscopy plasmon surface polariton enhanced raman spectroscopy fouriertransform raman spectroscopy waveguide surface coherent anti—stokes raman spectroscopy（wscars） 5.5 selected examples of thin film analyses raman spectral characterization of langmuir—blodgett layers of arachidate and stearate salts raman spectral characterization of self—assembled monolayers of alkanethiols on metals surface enhanced resonance raman spectral characterization of langmuir—blodgett layers of phthalocyanines 5.6 prospects for raman spectroscopic characterization of thin films surface potential 6.1 introduction 6.2 origins of the contact potential difference and surface potential the work function contact potential difference and surface potential surface potential changes induced by adsorbates 6.3 measurement of surface potential capacitancetechniques ionizing—probetechnique 6.4 surface potentials of organicthin films air—water interface： surface potential of langmuir mono— layers air—solidlnterface： surface potential of l—b and related films 6.5 conclusions x—ray diffraction 7.1 introduction 7.2 basic principles 7.3 structure normal to film plane 7.4 structure within the film plane 7.5 summary high resolution eels studies of organic thin films and surfaces 8.1 introduction 8.2 thescatteringmechanism dipolescattering impact scattering resonance scattering 8.3 thespectrometer 8.4 eels versus other techniques： advantages and disadvantages 8.5 examples resolutionenhancement linearity depth sensitivity molecular orientation local versus long—range lnteractions surfaces egregation 8.6 conclusions wetting 9.1 introduction 9.2 contactangles 9.3 techniques for contact angle measurements axisymmetric drop shapeanalysis—profile （adsa—p） axisymmetric drop shape analysis—contact diameter （adsa—cd） capillary rise technique 9.4 phase rule for moderately curved surface systems 9.5 equation of state forinterfacialtensions of solid— liquid systems 9.6 drop size dependence of contact angle and line tension 9.7 contact angles in the presence ofa thin liquid film 9.8 effects ofelastic liquid—vaporlnterfaces on wetting secondary ion mass spectrometry as applied to thin organic and polymeric films 10.1 introduction and background overview of the sims method and experiment ion formationmechanisms comparisons to other surface analysis techniques the motivation for thin organic films as model systems 10.2 qualitative information： mechanisms ofsecondary molecularlon formation structure—ion formation relationships applications to self—assembled film chemistry 10.3 the study ofsampling depth in the sims experiment 10.4 quantitationin sims development of quantitation methods applicationof quantitative schemes to thin film chemistry 10.5 imagingapplications 10.6 summary and prospects x—ray photoelectron spectroscopy of organic thin films 11.1 introduction 11.2 experimental considerations 11.3 binding energy shifts 11.4 xps of molten films 11.5 angular dependent xps 11.6 etoaxps of self—assembled monolayers 11.7 conclusions molecular orientation in thin films as probed by optical second harmonic generation 12.1 introduction 12.2 experimental considerations 12.3 molecular nonlinear polarizabiliry calculation 12.4 measurements of the surface nonlinear susceptibility 12.5 molecular orientation calculation casel：βzzzonly case2：βzxxonly case3： βxxz（=βxzx）only case4：βzzz and βzxx case5： βzxx and βxxz（=βxzx） 12.6 absolute molecular orientation measurements 12.7 summary and conclusions appendix： technique summaries i auger electron spectroscopy（aes） 2 dynamicsecondarylon mass spectrometry （dynamicsims） 252 3 fouriertransformlnfraredspectroscopy（ftir） 253 4 high—resolution electron energy loss spectroscopy （hreels） 5 low—energy electron diffraction（leed） 6 raman spectroscopy 7 scanning electron microscopy（sem） 8 scanning tunneling microscopy（stm） and scanning force microscopy （sfm） 9 static secondarylon mass spectrometry （static sims） 10 transmission electron microscopy（tem） 11 variable—angle spectroscopic ellipsometry（vase） 12 x—ray diffraction xrd） 13 x—ray fluorescence（xrf） 14 x—ray photoelectron spectroscopy（xps） index 

封面

书名:有机薄膜的表征

作者:C. Richard Brundle，C

页数:276

定价:¥98.0

出版社:哈尔滨工业大学出版社

出版日期:2014-01-01

ISBN:9787560342870

PDF电子书大小:134MB